BibTeX record journals/tase/FanCT22

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@article{DBLP:journals/tase/FanCT22,
  author       = {Shu{-}Kai S. Fan and
                  Chun{-}Wei Cheng and
                  Du{-}Ming Tsai},
  title        = {Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between
                  Front-End-of-Line and Back-End-of-Line Processes},
  journal      = {{IEEE} Trans Autom. Sci. Eng.},
  volume       = {19},
  number       = {4},
  pages        = {3068--3082},
  year         = {2022},
  url          = {https://doi.org/10.1109/TASE.2021.3106011},
  doi          = {10.1109/TASE.2021.3106011},
  timestamp    = {Sun, 13 Nov 2022 17:52:51 +0100},
  biburl       = {https://dblp.org/rec/journals/tase/FanCT22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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