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BibTeX record journals/sigbed/RohloffLS06
@article{DBLP:journals/sigbed/RohloffLS06, author = {Kurt Rohloff and Joseph P. Loyall and Richard E. Schantz}, title = {Quality measures for embedded systems and their application to control and certification}, journal = {{SIGBED} Rev.}, volume = {3}, number = {4}, pages = {58--62}, year = {2006}, url = {https://doi.org/10.1145/1183088.1183095}, doi = {10.1145/1183088.1183095}, timestamp = {Sun, 21 Jun 2020 17:41:34 +0200}, biburl = {https://dblp.org/rec/journals/sigbed/RohloffLS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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