"Quality measures for embedded systems and their application to control and ..."

Kurt Rohloff, Joseph P. Loyall, Richard E. Schantz (2006)

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DOI: 10.1145/1183088.1183095

access: closed

type: Journal Article

metadata version: 2020-06-21

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Kurt Rohloff, Joseph P. Loyall, Richard E. Schantz:
Quality measures for embedded systems and their application to control and certification. SIGBED Rev. 3(4): 58-62 (2006)

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