BibTeX record journals/sensors/OrtleppSM21

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@article{DBLP:journals/sensors/OrtleppSM21,
  author       = {Ingo Ortlepp and
                  Jaqueline Stauffenberg and
                  Eberhard Manske},
  title        = {Processing and Analysis of Long-Range Scans with an Atomic Force Microscope
                  {(AFM)} in Combination with Nanopositioning and Nanomeasuring Technology
                  for Defect Detection and Quality Control},
  journal      = {Sensors},
  volume       = {21},
  number       = {17},
  pages        = {5862},
  year         = {2021},
  url          = {https://doi.org/10.3390/s21175862},
  doi          = {10.3390/S21175862},
  timestamp    = {Thu, 16 Sep 2021 18:04:47 +0200},
  biburl       = {https://dblp.org/rec/journals/sensors/OrtleppSM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}