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BibTeX record journals/sensors/OrtleppSM21
@article{DBLP:journals/sensors/OrtleppSM21, author = {Ingo Ortlepp and Jaqueline Stauffenberg and Eberhard Manske}, title = {Processing and Analysis of Long-Range Scans with an Atomic Force Microscope {(AFM)} in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control}, journal = {Sensors}, volume = {21}, number = {17}, pages = {5862}, year = {2021}, url = {https://doi.org/10.3390/s21175862}, doi = {10.3390/S21175862}, timestamp = {Thu, 16 Sep 2021 18:04:47 +0200}, biburl = {https://dblp.org/rec/journals/sensors/OrtleppSM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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