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"Processing and Analysis of Long-Range Scans with an Atomic Force ..."

Ingo Ortlepp, Jaqueline Stauffenberg, Eberhard Manske (2021)

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DOI: 10.3390/S21175862

access: open

type: Journal Article

metadata version: 2021-09-16

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Ingo Ortlepp, Jaqueline Stauffenberg, Eberhard Manske:
Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control. Sensors 21(17): 5862 (2021)

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