BibTeX record journals/mr/ZhangAB18

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@article{DBLP:journals/mr/ZhangAB18,
  author       = {Teng Zhang and
                  Bruno Allard and
                  Jinshun Bi},
  title        = {The synergetic effects of high temperature gate bias and total ionization
                  dose on 1.2{\unicode{8239}}kV SiC devices},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {631--635},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.046},
  doi          = {10.1016/J.MICROREL.2018.06.046},
  timestamp    = {Wed, 25 Oct 2023 22:40:54 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangAB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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