BibTeX record journals/mr/XieABYYZN02

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@article{DBLP:journals/mr/XieABYYZN02,
  author       = {Huimin Xie and
                  Anand K. Asundi and
                  Chai Gin Boay and
                  Lu Yunguang and
                  Jin Yu and
                  Zhaowei Zhong and
                  Bryan K. A. Ngoi},
  title        = {High resolution {AFM} scanning Moir{\'{e}} method and its application
                  to the micro-deformation in the {BGA} electronic package},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {8},
  pages        = {1219--1227},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00084-7},
  doi          = {10.1016/S0026-2714(02)00084-7},
  timestamp    = {Mon, 26 Oct 2020 08:59:24 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/XieABYYZN02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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