BibTeX record journals/mr/WurflKBMRW01

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@article{DBLP:journals/mr/WurflKBMRW01,
  author       = {Joachim W{\"{u}}rfl and
                  Paul Kurpas and
                  Frank Brunner and
                  Michael Mai and
                  Matthias Rudolph and
                  Markus Weyers},
  title        = {Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined
                  temperature and current stressing},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {8},
  pages        = {1103--1108},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00081-6},
  doi          = {10.1016/S0026-2714(01)00081-6},
  timestamp    = {Thu, 14 Oct 2021 09:38:37 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WurflKBMRW01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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