@article{DBLP:journals/mr/WurflKBMRW01,
  author    = {Joachim W{\"u}rfl and
               Paul Kurpas and
               Frank Brunner and
               Michael Mai and
               Matthias Rudolph and
               Markus Weyers},
  title     = {Degradation properties of MOVPE-grown GaInP/GaAs HBTs under
               combined temperature and current stressing},
  journal   = {Microelectronics Reliability},
  volume    = {41},
  number    = {8},
  year      = {2001},
  pages     = {1103-1108},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(01)00081-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}