Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined ..."

Joachim Würfl et al. (2001)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(01)00081-6

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/WurflKBMRW01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/WurflKBMRW01
Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers:
Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. Microelectron. Reliab. 41(8): 1103-1108 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.