BibTeX record journals/mr/WhitingHLPJLKRX17

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@article{DBLP:journals/mr/WhitingHLPJLKRX17,
  author       = {Patrick G. Whiting and
                  M. R. Holzworth and
                  A. G. Lind and
                  Stephen J. Pearton and
                  Kevin S. Jones and
                  Lu Liu and
                  T. S. Kang and
                  Fan Ren and
                  Y. Xin},
  title        = {Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility
                  transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {70},
  pages        = {32--40},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.01.007},
  doi          = {10.1016/J.MICROREL.2017.01.007},
  timestamp    = {Sun, 06 Oct 2024 21:35:10 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WhitingHLPJLKRX17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}