BibTeX record journals/mr/WangZT07

download as .bib file

@article{DBLP:journals/mr/WangZT07,
  author       = {Zhichun Wang and
                  P. Zeelen and
                  H. Tigelaar},
  title        = {Importance of multi-temp testing in automotive qualification and zero
                  defects program},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1358--1361},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.026},
  doi          = {10.1016/J.MICROREL.2007.07.026},
  timestamp    = {Mon, 29 Mar 2021 08:53:48 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WangZT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.