BibTeX record journals/mr/VialeFCGA16

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@article{DBLP:journals/mr/VialeFCGA16,
  author       = {Benjamin Viale and
                  Mathieu Fer and
                  Lionel Courau and
                  Philippe Galy and
                  Bruno Allard},
  title        = {On the need for a new {ESD} verification methodology to improve the
                  reliability of ICs in advanced 28nm {UTBB} {FD-SOI} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {101--108},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.076},
  doi          = {10.1016/J.MICROREL.2016.07.076},
  timestamp    = {Wed, 23 Mar 2022 09:35:31 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/VialeFCGA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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