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"On the need for a new ESD verification methodology to improve the ..."
Benjamin Viale et al. (2016)
- Benjamin Viale, Mathieu Fer, Lionel Courau, Philippe Galy, Bruno Allard:
On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. Microelectron. Reliab. 64: 101-108 (2016)
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