BibTeX record journals/mr/VassilevJGVTHNSM03

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@article{DBLP:journals/mr/VassilevJGVTHNSM03,
  author       = {Vesselin K. Vassilev and
                  Snezana Jenei and
                  Guido Groeseneken and
                  Rafael Venegas and
                  Steven Thijs and
                  Vincent De Heyn and
                  M. Natarajan Iyer and
                  Michiel Steyaert and
                  Herman E. Maes},
  title        = {High frequency characterization and modelling of the parasitic {RC}
                  performance of two terminal {ESD} {CMOS} protection devices},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {7},
  pages        = {1011--1020},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00129-X},
  doi          = {10.1016/S0026-2714(03)00129-X},
  timestamp    = {Tue, 31 Oct 2023 07:48:39 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/VassilevJGVTHNSM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}