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BibTeX record journals/mr/VassilevJGVTHNSM03
@article{DBLP:journals/mr/VassilevJGVTHNSM03, author = {Vesselin K. Vassilev and Snezana Jenei and Guido Groeseneken and Rafael Venegas and Steven Thijs and Vincent De Heyn and M. Natarajan Iyer and Michiel Steyaert and Herman E. Maes}, title = {High frequency characterization and modelling of the parasitic {RC} performance of two terminal {ESD} {CMOS} protection devices}, journal = {Microelectron. Reliab.}, volume = {43}, number = {7}, pages = {1011--1020}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00129-X}, doi = {10.1016/S0026-2714(03)00129-X}, timestamp = {Tue, 31 Oct 2023 07:48:39 +0100}, biburl = {https://dblp.org/rec/journals/mr/VassilevJGVTHNSM03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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