BibTeX record journals/mr/VallabhaneniIMK17

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@article{DBLP:journals/mr/VallabhaneniIMK17,
  author       = {Renuka Vallabhaneni and
                  Ehsan Izadi and
                  Carl R. Mayer and
                  C. Shashank Kaira and
                  Sudhanshu S. Singh and
                  Jagannathan Rajagopalan and
                  Nikhilesh Chawla},
  title        = {In situ tensile testing of tin (Sn) whiskers in a focused ion beam
                  (FIB)/scanning electron microscope {(SEM)}},
  journal      = {Microelectron. Reliab.},
  volume       = {79},
  pages        = {314--320},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.042},
  doi          = {10.1016/J.MICROREL.2017.07.042},
  timestamp    = {Sat, 09 Apr 2022 12:31:59 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/VallabhaneniIMK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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