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"In situ tensile testing of tin (Sn) whiskers in a focused ion beam ..."

Renuka Vallabhaneni et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.042

access: closed

type: Journal Article

metadata version: 2022-04-09

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  - https://dblp.org/rec/journals/mr/VallabhaneniIMK17
Renuka Vallabhaneni, Ehsan Izadi, Carl R. Mayer, C. Shashank Kaira, Sudhanshu S. Singh, Jagannathan Rajagopalan, Nikhilesh Chawla:
In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM). Microelectron. Reliab. 79: 314-320 (2017)

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