BibTeX record journals/mr/TyaginovVSG06

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@article{DBLP:journals/mr/TyaginovVSG06,
  author       = {S. E. Tyaginov and
                  M. I. Vexler and
                  A. F. Shulekin and
                  I. V. Grekhov},
  title        = {The post-damage behavior of a {MOS} tunnel emitter transistor},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1035--1041},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.006},
  doi          = {10.1016/J.MICROREL.2005.10.006},
  timestamp    = {Sun, 02 Oct 2022 15:44:04 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TyaginovVSG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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