BibTeX record journals/mr/TsengLHLCCL10

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@article{DBLP:journals/mr/TsengLHLCCL10,
  author       = {H. W. Tseng and
                  C. T. Lu and
                  Y. H. Hsiao and
                  P. L. Liao and
                  Y. C. Chuang and
                  T. Y. Chung and
                  Cheng{-}Yi Liu},
  title        = {Electromigration-induced failures at Cu/Sn/Cu flip-chip joint interfaces},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {8},
  pages        = {1159--1162},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.05.002},
  doi          = {10.1016/J.MICROREL.2010.05.002},
  timestamp    = {Fri, 20 Oct 2023 17:04:45 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TsengLHLCCL10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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