BibTeX record journals/mr/TajalliMRMBZM17

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@article{DBLP:journals/mr/TajalliMRMBZM17,
  author       = {Alaleh Tajalli and
                  Matteo Meneghini and
                  Isabella Rossetto and
                  Peter Moens and
                  Abhishek Banerjee and
                  Enrico Zanoni and
                  Gaudenzio Meneghesso},
  title        = {Field and hot electron-induced degradation in GaN-based power MIS-HEMTs},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {282--286},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.021},
  doi          = {10.1016/J.MICROREL.2017.06.021},
  timestamp    = {Tue, 07 May 2024 20:21:53 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TajalliMRMBZM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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