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BibTeX record journals/mr/StadlerERZGWWQME05
@article{DBLP:journals/mr/StadlerERZGWWQME05, author = {Wolfgang Stadler and Kai Esmark and K. Reynders and M. Zubeidat and Michael Graf and Wolfgang Wilkening and J. Willemen and Ning Qu and S. Mettler and M. Etherton}, title = {Test circuits for fast and reliable assessment of {CDM} robustness of {I/O} stages}, journal = {Microelectron. Reliab.}, volume = {45}, number = {2}, pages = {269--277}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2004.05.014}, doi = {10.1016/J.MICROREL.2004.05.014}, timestamp = {Wed, 16 Mar 2022 23:54:29 +0100}, biburl = {https://dblp.org/rec/journals/mr/StadlerERZGWWQME05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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