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"Test circuits for fast and reliable assessment of CDM robustness of I/O ..."
Wolfgang Stadler et al. (2005)
- Wolfgang Stadler, Kai Esmark, K. Reynders, M. Zubeidat, Michael Graf, Wolfgang Wilkening, J. Willemen, Ning Qu, S. Mettler, M. Etherton:
Test circuits for fast and reliable assessment of CDM robustness of I/O stages. Microelectron. Reliab. 45(2): 269-277 (2005)
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