BibTeX record journals/mr/SowarirajSSMK03

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@article{DBLP:journals/mr/SowarirajSSMK03,
  author       = {M. S. B. Sowariraj and
                  Theo Smedes and
                  Cora Salm and
                  Ton J. Mouthaan and
                  Fred G. Kuper},
  title        = {Role of package parasitics and substrate resistance on the Charged
                  Device Model {(CDM)} failure levels -An explanation and die protection
                  strategy},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1569--1575},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00276-2},
  doi          = {10.1016/S0026-2714(03)00276-2},
  timestamp    = {Thu, 14 Oct 2021 09:38:41 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SowarirajSSMK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}