"Role of package parasitics and substrate resistance on the Charged Device ..."

M. S. B. Sowariraj et al. (2003)

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DOI: 10.1016/S0026-2714(03)00276-2

access: closed

type: Journal Article

metadata version: 2021-10-14

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M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper:
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectron. Reliab. 43(9-11): 1569-1575 (2003)

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