BibTeX record journals/mr/SowarirajSSMK02

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@article{DBLP:journals/mr/SowarirajSSMK02,
  author       = {M. S. B. Sowariraj and
                  Theo Smedes and
                  Cora Salm and
                  Ton J. Mouthaan and
                  Fred G. Kuper},
  title        = {The influence of technology variation on ggNMOSTs and SCRs against
                  {CDM} {BSD} stress},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1287--1292},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00136-1},
  doi          = {10.1016/S0026-2714(02)00136-1},
  timestamp    = {Thu, 14 Oct 2021 09:38:42 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SowarirajSSMK02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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