BibTeX record journals/mr/SongMU17

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@article{DBLP:journals/mr/SongMU17,
  author       = {Sungyoung Song and
                  Stig Munk{-}Nielsen and
                  Christian Uhrenfeldt},
  title        = {Failure mechanism analysis of off-state drain-to-source leakage current
                  failure of a commercial 650 {V} discrete GaN-on-Si {HEMT} power device
                  by accelerated power cycling test},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {539--543},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.011},
  doi          = {10.1016/J.MICROREL.2017.07.011},
  timestamp    = {Tue, 07 May 2024 20:21:53 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SongMU17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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