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"Failure mechanism analysis of off-state drain-to-source leakage current ..."

Sungyoung Song, Stig Munk-Nielsen, Christian Uhrenfeldt (2017)

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DOI: 10.1016/J.MICROREL.2017.07.011

access: closed

type: Journal Article

metadata version: 2024-05-07

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Sungyoung Song, Stig Munk-Nielsen, Christian Uhrenfeldt:
Failure mechanism analysis of off-state drain-to-source leakage current failure of a commercial 650 V discrete GaN-on-Si HEMT power device by accelerated power cycling test. Microelectron. Reliab. 76-77: 539-543 (2017)

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