BibTeX record journals/mr/ShubhakarRKBWOP14

• > Home > journals/mr/ShubhakarRKBWOP14

@article{DBLP:journals/mr/ShubhakarRKBWOP14,
  author       = {Kalya Shubhakar and
                  Nagarajan Raghavan and
                  Sunil Singh Kushvaha and
                  Michel Bosman and
                  Zhongrui Wang and
                  Sean J. O'Shea and
                  Kin Leong Pey},
  title        = {Impact of local structural and electrical properties of grain boundaries
                  in polycrystalline HfO\({}_{\mbox{2}}\) on reliability of SiO\({}_{\mbox{x}}\)
                  interfacial layer},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {1712--1717},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.154},
  doi          = {10.1016/J.MICROREL.2014.07.154},
  timestamp    = {Tue, 21 Mar 2023 21:14:34 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ShubhakarRKBWOP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}