BibTeX record journals/mr/SamantaZC10

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@article{DBLP:journals/mr/SamantaZC10,
  author       = {Piyas Samanta and
                  Chunxiang Zhu and
                  Mansun Chan},
  title        = {Comparison of electrical stress-induced charge carrier generation/trapping
                  and related degradation of SiO\({}_{\mbox{2}}\) and HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\)
                  gate dielectric stacks},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {12},
  pages        = {1907--1914},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.005},
  doi          = {10.1016/J.MICROREL.2010.07.005},
  timestamp    = {Sat, 22 Feb 2020 19:28:42 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SamantaZC10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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