"Comparison of electrical stress-induced charge carrier generation/trapping ..."

Piyas Samanta, Chunxiang Zhu, Mansun Chan (2010)

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DOI: 10.1016/J.MICROREL.2010.07.005

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type: Journal Article

metadata version: 2025-03-03

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Piyas Samanta, Chunxiang Zhu, Mansun Chan:
Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO₂ and HfO₂/SiO₂ gate dielectric stacks. Microelectron. Reliab. 50(12): 1907-1914 (2010)

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