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"Comparison of electrical stress-induced charge carrier generation/trapping ..."
Piyas Samanta, Chunxiang Zhu, Mansun Chan (2010)
- Piyas Samanta, Chunxiang Zhu, Mansun Chan
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Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO2 and HfO2/SiO2 gate dielectric stacks. Microelectron. Reliab. 50(12): 1907-1914 (2010)
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