BibTeX record journals/mr/RuanNPTPVICP09

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@article{DBLP:journals/mr/RuanNPTPVICP09,
  author       = {Jinyu Jason Ruan and
                  Nicolas Nolhier and
                  George J. Papaioannou and
                  David Tr{\'{e}}mouilles and
                  Vincent Puyal and
                  C. Villeneuve and
                  T. Idda and
                  Fabio Coccetti and
                  Robert Plana},
  title        = {Accelerated lifetime test of {RF-MEMS} switches under {ESD} stress},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1256--1259},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.023},
  doi          = {10.1016/J.MICROREL.2009.06.023},
  timestamp    = {Sun, 04 Aug 2024 19:50:26 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RuanNPTPVICP09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}