"Accelerated lifetime test of RF-MEMS switches under ESD stress."

Jinyu Jason Ruan et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.023

access: closed

type: Journal Article

metadata version: 2024-08-04

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Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana:
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49(9-11): 1256-1259 (2009)

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