BibTeX record journals/mr/RossVKRPP17

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@article{DBLP:journals/mr/RossVKRPP17,
  author       = {Glenn Ross and
                  Vesa Vuorinen and
                  Michael Krause and
                  S. Reissaus and
                  Matthias Petzold and
                  Mervi Paulasto{-}Kr{\"{o}}ckel},
  title        = {{XRD} and ToF-SIMS study of intermetallic void formation in Cu-Sn
                  micro-connects},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {390--394},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.044},
  doi          = {10.1016/J.MICROREL.2017.07.044},
  timestamp    = {Thu, 28 Oct 2021 16:34:18 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RossVKRPP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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