BibTeX record journals/mr/ReinerGS02

download as .bib file

@article{DBLP:journals/mr/ReinerGS02,
  author       = {Joachim C. Reiner and
                  Philippe Gasser and
                  Urs Sennhauser},
  title        = {Novel FIB-based sample preparation technique for {TEM} analysis of
                  ultra-thin gate oxide breakdown},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1753--1757},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00225-1},
  doi          = {10.1016/S0026-2714(02)00225-1},
  timestamp    = {Sat, 22 Feb 2020 19:27:22 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ReinerGS02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.