BibTeX record journals/mr/RafiSHMCOC06

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@article{DBLP:journals/mr/RafiSHMCOC06,
  author       = {Joan Marc Raf{\'{\i}} and
                  Eddy Simoen and
                  Kiyoteru Hayama and
                  Abdelkarim Mercha and
                  Francesca Campabadal and
                  Hidenori Ohyama and
                  Cor Claeys},
  title        = {Hot-carrier-induced degradation of drain current hysteresis and transients
                  in thin gate oxide floating body partially depleted {SOI} nMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1657--1663},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.037},
  doi          = {10.1016/J.MICROREL.2006.07.037},
  timestamp    = {Sat, 22 Feb 2020 19:28:58 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RafiSHMCOC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}