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BibTeX record journals/mr/RafiSHMCOC06
@article{DBLP:journals/mr/RafiSHMCOC06, author = {Joan Marc Raf{\'{\i}} and Eddy Simoen and Kiyoteru Hayama and Abdelkarim Mercha and Francesca Campabadal and Hidenori Ohyama and Cor Claeys}, title = {Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted {SOI} nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1657--1663}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.037}, doi = {10.1016/J.MICROREL.2006.07.037}, timestamp = {Sat, 22 Feb 2020 19:28:58 +0100}, biburl = {https://dblp.org/rec/journals/mr/RafiSHMCOC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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