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"Hot-carrier-induced degradation of drain current hysteresis and transients ..."

Joan Marc Rafí et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.037

access: closed

type: Journal Article

metadata version: 2020-02-22

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Joan Marc Rafí, Eddy Simoen, Kiyoteru Hayama, Abdelkarim Mercha, Francesca Campabadal, Hidenori Ohyama, Cor Claeys:
Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. Microelectron. Reliab. 46(9-11): 1657-1663 (2006)

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