BibTeX record journals/mr/PicGO07

download as .bib file

@article{DBLP:journals/mr/PicGO07,
  author       = {D. Pic and
                  Didier Goguenheim and
                  Jean{-}Luc Ogier},
  title        = {A comprehensive study of stress induced leakage current using a floating
                  gate structure for direct applications in {EEPROM} memories},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1373--1377},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.040},
  doi          = {10.1016/J.MICROREL.2007.07.040},
  timestamp    = {Sat, 22 Feb 2020 19:27:02 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PicGO07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.