BibTeX record journals/mr/LossyBW12

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@article{DBLP:journals/mr/LossyBW12,
  author       = {Richard Lossy and
                  Herv{\'{e}} Blanck and
                  Joachim W{\"{u}}rfl},
  title        = {Reliability studies on GaN HEMTs with sputtered Iridium gate module},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {2144--2148},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.154},
  doi          = {10.1016/J.MICROREL.2012.06.154},
  timestamp    = {Sat, 22 Feb 2020 19:27:13 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LossyBW12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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