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"Reliability studies on GaN HEMTs with sputtered Iridium gate module."
Richard Lossy, Hervé Blanck, Joachim Würfl (2012)
- Richard Lossy, Hervé Blanck, Joachim Würfl:
Reliability studies on GaN HEMTs with sputtered Iridium gate module. Microelectron. Reliab. 52(9-10): 2144-2148 (2012)
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