BibTeX record journals/mr/LeBET16

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@article{DBLP:journals/mr/LeBET16,
  author       = {Van Nhat Le and
                  Lahouari Benabou and
                  Victor Etgens and
                  Quang Bang Tao},
  title        = {Finite element analysis of the effect of process-induced voids on
                  the fatigue lifetime of a lead-free solder joint under thermal cycling},
  journal      = {Microelectron. Reliab.},
  volume       = {65},
  pages        = {243--254},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.098},
  doi          = {10.1016/J.MICROREL.2016.07.098},
  timestamp    = {Sat, 22 Feb 2020 19:26:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeBET16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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