BibTeX record journals/mr/JeonP04

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@article{DBLP:journals/mr/JeonP04,
  author       = {Insu Jeon and
                  Young{-}Bae Park},
  title        = {Analysis of the reservoir effect on electromigration reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {6},
  pages        = {917--928},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.02.001},
  doi          = {10.1016/J.MICROREL.2004.02.001},
  timestamp    = {Sat, 22 Feb 2020 19:28:16 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JeonP04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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