"Analysis of the reservoir effect on electromigration reliability."

Insu Jeon, Young-Bae Park (2004)

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DOI: 10.1016/J.MICROREL.2004.02.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Insu Jeon, Young-Bae Park:
Analysis of the reservoir effect on electromigration reliability. Microelectron. Reliab. 44(6): 917-928 (2004)

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