BibTeX record journals/mr/HuangCHHLC08

download as .bib file

@article{DBLP:journals/mr/HuangCHHLC08,
  author       = {Sheng{-}Yi Huang and
                  Kun{-}Ming Chen and
                  Guo{-}Wei Huang and
                  Cheng{-}Chou Hung and
                  Wen{-}Shiang Liao and
                  Chun{-}Yen Chang},
  title        = {Electrical stress effect on {RF} power characteristics of SiGe hetero-junction
                  bipolar transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {2},
  pages        = {193--199},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2007.05.008},
  doi          = {10.1016/J.MICROREL.2007.05.008},
  timestamp    = {Sat, 22 Feb 2020 19:27:11 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangCHHLC08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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