@article{DBLP:journals/mr/HayamaTSORMSC06,
  author    = {K. Hayama and
               K. Takakura and
               K. Shigaki and
               H. Ohyama and
               J. M. Raf\'{\i} and
               Abdelkarim Mercha and
               Eddy Simoen and
               Cor Claeys},
  title     = {Impact on the back gate degradation in partially depleted
               SOI n-MOSFETs by 2-MeV electron irradiation},
  journal   = {Microelectronics Reliability},
  volume    = {46},
  number    = {9-11},
  year      = {2006},
  pages     = {1731-1735},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2006.07.063},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}