BibTeX record: journals/mr/HayamaTSORMSC06

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@article{DBLP:journals/mr/HayamaTSORMSC06,
  author    = {K. Hayama and
               K. Takakura and
               K. Shigaki and
               H. Ohyama and
               J. M. Raf{\'{\i}} and
               Abdelkarim Mercha and
               Eddy Simoen and
               Cor Claeys},
  title     = {Impact on the back gate degradation in partially depleted {SOI} n-MOSFETs
               by 2-MeV electron irradiation},
  journal   = {Microelectronics Reliability},
  year      = {2006},
  volume    = {46},
  number    = {9-11},
  pages     = {1731--1735},
  url       = {http://dx.doi.org/10.1016/j.microrel.2006.07.063},
  doi       = {10.1016/j.microrel.2006.07.063},
  timestamp = {Wed, 22 Oct 2014 07:21:50 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/HayamaTSORMSC06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}