BibTeX record journals/mr/HayamaTSORMSC06

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@article{DBLP:journals/mr/HayamaTSORMSC06,
  author       = {Kiyoteru Hayama and
                  Kenichiro Takakura and
                  K. Shigaki and
                  Hidenori Ohyama and
                  Joan Marc Raf{\'{\i}} and
                  Abdelkarim Mercha and
                  Eddy Simoen and
                  Cor Claeys},
  title        = {Impact on the back gate degradation in partially depleted {SOI} n-MOSFETs
                  by 2-MeV electron irradiation},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1731--1735},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.063},
  doi          = {10.1016/J.MICROREL.2006.07.063},
  timestamp    = {Sat, 22 Feb 2020 19:27:30 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HayamaTSORMSC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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