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"Impact on the back gate degradation in partially depleted SOI n-MOSFETs by ..."
Kiyoteru Hayama et al. (2006)
- Kiyoteru Hayama, Kenichiro Takakura, K. Shigaki, Hidenori Ohyama, Joan Marc Rafí
, Abdelkarim Mercha, Eddy Simoen, Cor Claeys:
Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectron. Reliab. 46(9-11): 1731-1735 (2006)
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