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BibTeX record journals/mr/GonfFZW01
@article{DBLP:journals/mr/GonfFZW01, author = {K. Gonf and H. G. Feng and R. Y. Zhan and A. Z. Wang}, title = {ESD-Induced Circuit Performance Degradation in RFICs}, journal = {Microelectron. Reliab.}, volume = {41}, number = {9-10}, pages = {1379--1383}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00144-5}, doi = {10.1016/S0026-2714(01)00144-5}, timestamp = {Sat, 22 Feb 2020 19:27:09 +0100}, biburl = {https://dblp.org/rec/journals/mr/GonfFZW01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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