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"ESD-Induced Circuit Performance Degradation in RFICs."
K. Gonf et al. (2001)
- K. Gonf, H. G. Feng, R. Y. Zhan, A. Z. Wang:
ESD-Induced Circuit Performance Degradation in RFICs. Microelectron. Reliab. 41(9-10): 1379-1383 (2001)
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