BibTeX record journals/mr/GiretBFARG02

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@article{DBLP:journals/mr/GiretBFARG02,
  author       = {C. Giret and
                  D. Bru and
                  D. Faure and
                  C. Ali and
                  M. Razani and
                  D. Gobled},
  title        = {Electrical characteristics measurement of transistors by 4 tips-0.2
                  micron probing technique in Semiconductor Failure Analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1723--1727},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00220-2},
  doi          = {10.1016/S0026-2714(02)00220-2},
  timestamp    = {Sat, 22 Feb 2020 19:27:37 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GiretBFARG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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