BibTeX record journals/mr/GhidiniGGGBPSCI03

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@article{DBLP:journals/mr/GhidiniGGGBPSCI03,
  author       = {G. Ghidini and
                  A. Garavaglia and
                  G. Giusto and
                  Andrea Ghetti and
                  R. Bottini and
                  D. Peschiaroli and
                  M. Scaravaggi and
                  F. Cazzaniga and
                  Daniele Ielmini},
  title        = {Impact of gate stack process on conduction and reliability of 0.18
                  mum {PMOSFET}},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1221--1227},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00175-6},
  doi          = {10.1016/S0026-2714(03)00175-6},
  timestamp    = {Sun, 02 Oct 2022 15:44:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GhidiniGGGBPSCI03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}