BibTeX record journals/mr/GalyDVREJPB09

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@article{DBLP:journals/mr/GalyDVREJPB09,
  author       = {Philippe Galy and
                  Sylvain Dudit and
                  Michel Vallet and
                  Corinne Richier and
                  Christophe Entringer and
                  Frank Jezequel and
                  E. Petit and
                  J. Beltritti},
  title        = {Impact and damage on deep sub-micron {CMOS} technology induced by
                  substrate current due to {ESD} stress},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1107--1110},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.039},
  doi          = {10.1016/J.MICROREL.2009.07.039},
  timestamp    = {Wed, 08 Nov 2023 07:52:01 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GalyDVREJPB09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}