BibTeX record journals/mr/FleetwoodRTZBWSP07

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@article{DBLP:journals/mr/FleetwoodRTZBWSP07,
  author       = {Daniel M. Fleetwood and
                  M. P. Rodgers and
                  L. Tsetseris and
                  X. J. Zhou and
                  I. Batyrev and
                  S. Wang and
                  Ronald D. Schrimpf and
                  Sokrates T. Pantelides},
  title        = {Effects of device aging on microelectronics radiation response and
                  reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {7},
  pages        = {1075--1085},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.06.009},
  doi          = {10.1016/J.MICROREL.2006.06.009},
  timestamp    = {Sat, 22 Feb 2020 19:27:12 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FleetwoodRTZBWSP07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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